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Agilent

LTE Master and System Information Block Recovery

in Video, Agilent, LTE

This is a demonstration of how the master information block and system information blocks can be recovered from the LTEi downlink signal using the Agilent 89600 VSA signal analysis software.

Agilent and Innofidei collaborate to develop RF tests for TD-LTE chipset

in News, Agilent, Innofidei, TD-LTE, LTE

Agilent and Innofidei have announced joint development to complete the requirements for a TD-LTE data dongle RF test.

Understanding Cross Modulation Effects in a Full Duplex LTE Transceiver

in Webinar, Agilent, RFIC, Transceiver, LTE

Date: Thurseday, July 22, 2010
Time: 10:00 - 11:00 Pacific
Host: Agilent Technologies

Stimulus-Response Testing for LTE Components

in Whitepaper, Agilent, Testing, LTE

Agilent - This application note begins with a brief overview of the physical layer in the LTE standards.

Agilent Chipset Software Supports picoChip Femtocell Test

in News, Agilent, picoChip, Femtocell

Agilent Technologies and picoChip has announced a high-volume manufacturing test solution for 3G femtocell products.

Agilent collaborates to enhance the rapid development of LTE Test Solutions

in News, Agilent, LTE Test Solution, Testing, LTE

Agilent Technologies Inc has announced a strategic partnership with Innowireless Co, Ltd to enhance the rapid development of LTE wireless test platforms. 

Agilent to Showcase LTE Test Solutions at LTE World Summit 2010

in News, Agilent, LTE World Summit, Testing, LTE

Agilent Technologies today announced that it will demonstrate the latest LTE test application solutions at the LTE World Summit 2010, May 17 - 19, in Amsterdam, at the Hotel Okura, Booth 30.

Agilent Technologies offers New Signal Studio for 3GPP LTE and VSA Software Capabilities

in News, 3GPP, Agilent, LTE

Agilent Technologies Inc today announced the availability of key enhancements to its Signal Studio for 3GPP LTE and 89600 Vector Signal Analysis (VSA) software.

Completing LTE eNB Closed-loop Conformance Tests

in Webinar, Agilent, Testing, eNB, LTE

Date: 2010-05-27
Time: 11:00 - 00:00 Pacific

LTE eNB MIMO Receiver Baseband Testing using N5106A PXB

in Video, Agilent, Baseband, Testing, MIMO, eNB

Demonstration of SystemVue generated ARB waveforms being used in PXB baseband generator and channel emulator and output to Xilinx Vertex6 development board over new VITA57 digital interface.

video: 

Agilent Technologies to Display Latest Wireless Test Solutions at CTIA WIRELESS 2010

in News, 3GPP, Agilent, GAN, HSPA+, TD-LTE, UMA, EDGE, LTE, WCDMA, WiMAX

March 9, 2010 - Agilent Technologies Inc today announced it will demonstrate the latest wireless test and measurement solutions at CTIA WIRELESS 2010, March 23-25, Las Vegas Convention Center, Boot

Agilent to Sell Network Solutions Business to JDSU

in News, Agilent, LTE

February 11, 2010 – Agilent Technologies Inc. today announced it has signed a definitive agreement to sell its network solutions business to JDSU. JDSU will pay Agilent $165 million in cash.

Agilent

in Technology, Agilent, LTE, Manufacturer

First to deliver 3GPP LTE design automation, signal generation and signal analysis tools, Agilent has recently added protocol test and network signaling analysis solutions.