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Anritsu Expands LTE Field Test Instrument Portfolio

in News, Anritsu, OTA, LTE

March 22, 2010 - Anritsu Company expands its LTE test portfolio with the introduction of options for its MS2712E and MS2713E Spectrum Master handheld spectrum analyzers. The new options allow field engineers and technicians to conduct RF, modulation, and Over-the-Air (OTA) measurements on 10 MHz LTE signals during the deployment, installation, and operation of LTE networks.

The LTE RF measurement option allows users to accurately and quickly validate the RF quality and performance of LTE signals. It can also help field technicians troubleshoot RF problems associated with LTE signals. With the LTE modulation quality measurement option, Error Vector Magnitude (EVM), frequency error, and Control Channel power tests can be conducted. When the Spectrum Master analyzers are equipped with the OTA option, users can validate the over-the-air performance of the complete eNode-B system, as well as troubleshoot problems with the LTE signal. The OTA option can also be used to verify/validate LTE signal coverage with the instruments’ scanner functionality.

Designed for Use with Handheld Analyzers

Covering the 100 kHz to 6 GHz frequency, the MS2712E/MS2713E handheld spectrum analyzers deliver superior interference analysis capabilities and the ability to assess signal quality across a broad range of increasingly complex RF signals. They can locate difficult-to-detect interfering signals – including both intermittent and continuous ones – resulting from the proliferation of wireless systems and an ever-crowding RF spectrum. The instruments have dynamic range of >95 dB, DANL of -152 dBm in 10 Hz RBW, and typical phase noise of -110 dBc/Hz max @ 10 kHz offset at 1 GHz. Unlike competitive instruments, the Spectrum Master delivers a small, compact, cost-effective, intuitive, easy-to-use solution with superior interference analysis capabilities, phase noise, dynamic range, and sweep speed

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